[Mobile library] A Designerrsquo;s Guide to Built-In Self-Test (Frontiers in Electronic Testing)
✿ Charles E. Stroud ✿
#4600093 in eBooks 2006-04-11 2006-04-11File Name: B000SPD3I8
0 of 0 people found the following review helpful. good coverage of BIST methodsBy W BoudvilleBuilt-in Self-Test is now highly desirable in chip design. As the linewidth keeps decreasing, and the number of transistors rises, the sheer complexity necessitates BIST as a basic design principle. Hence Stroud offers you a recent and timely survey of BIST methods. The writing quality is not bad, and he gives a good coverage of the most common methods used in the industry.Whether some of these prove prA recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations. [PDF.yj67] A Designerrsquo;s Guide to Built-In Self-Test (Frontiers in Electronic Testing) Rating: 3.61 (519 Votes)
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