[Free] High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
☆ R. Dean Adams ☆
#4439529 in eBooks 2006-04-11 2006-04-11File Name: B006028T3C
5 of 7 people found the following review helpful. A rare treatBy JTC____ In the world of semiconductor memory design, testing and diagnosis, information is scattered in papers, journals of various disciplines. Although text books are available, the coverage is often limited toacademic theories, models and algorithms. The more practical knowledge, unfortunately, have been mistakenly guarded as secret as a whole, although is often common knowledge for years among those in the field.____ The lackFrom the reviews: "Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of theAre memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, me... [PDF.jm98] High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing) Rating: 4.85 (688 Votes)
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You easily download any file type for your device.High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing) | R. Dean Adams. I really enjoyed this book and have already told so many people about it!
